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Fundamental Principles of Engineering Nanometrology eBook

Original price was: $160.00.Current price is: $80.00.

By: Richard Leach
Publisher: William Andrew Publishing
Print ISBN: 9780080964546, 0080964540
eText ISBN: 9781437778328
Pages: 352
Copyright year: 2010

Fundamental Principles of Engineering Nanometrology eBook

Original price was: $160.00.Current price is: $80.00.

Delivery: Can be download immediately after purchasing. For new customer, we need process for verification from 30 mins to 12 hours.
Version: PDF/EPUB. If you need EPUB and MOBI Version, please send contact us.
Compatible Devices: Can be read on any devices.
 provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study.

Fundamental Principles of Engineering Nanometrology

  • Provides a basic introduction to measurement and instruments
  • Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force
  • Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal , variable focus, and scattering instruments)
  • Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties)
  • Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge

Additional ISBNs

9781437778328, 1437778321

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